MetroFlex - Need for flexible CT metrology solutions

In this FWO/SBO-project, we propose a radical paradigm shift by breaking with the traditional X-ray 3D metrology workflow through developing a new framework for 3D metrology.

6th User Group Meeting

21-09-2020 (telcon-MS Teams meeting)




MetroFlex Meetings


Prof. Dr. Jan Sijbers Campus Drie Eiken, Building N
Edegemsesteenweg 202
B-2610 Wilrijk
Tel. +32 3 2658911