MetroFlex - Need for flexible CT metrology solutions

In this FWO/SBO-project, we propose a radical paradigm shift by breaking with the traditional X-ray 3D metrology workflow through developing a new framework for 3D metrology.

6th User Group Meeting

21-09-2020 (telcon-MS Teams meeting)

 

 

 


MetroFlex Meetings


Contact

Prof. Dr. Jan Sijbers Campus Drie Eiken, Building N
N1.13
Edegemsesteenweg 202
B-2610 Wilrijk
Belgium
Tel. +32 3 2658911
jan.sijbers@uantwerpen.be