Publications

The validation problem of joint emission/transmission reconstruction from TOF-PET projections
Nuyts J., Rezaei A., Defrise M.
IEEE Trans.  Radiation and Plasma Medical Science 2 (4), 6 pp. 7/2018

Forward Asteroseismic Modeling of Stars with a Convective Core from Gravity-mode Oscillations: Parameter Estimation and Stellar Model Selection
Aerts C., Molenberghs  G., Michielsen M., Pedersen M. G., Björklund R., Johnston C., Mombarg J. S. G., Bowman D. M., Buysschaert B., Pápics P. I., Sekaran S., Sundqvist J. O., Tkachenko A., Truyaert K., Van Reeth T., Vermeyen E.
The Astrophysical Journal Supplement Series, Volume 237, Issue 1, article id. 15, 31 pp. 6/2018

Combination of shape and X-ray inspection for apple internal quality control: in silico analysis of the methodology based on X-ray computed tomography
Van Dael M., Verboven P., Zanella A., Sijbers J., Nicolai B.
Postharvest Biology and Technology, in press. 5/2018

Time-of-flight PET time calibration using data consistency
Defrise M., Rezaei A., Nuyts J.
Phys. Med. Biol. 63, 105006 (14 pp). 5/2018

Single atom detection from low contrast-to-noise ratio electron microscopy images
Fatermans J., den Dekker A.J., Müller-Caspary K., Lobato I., O’Leary C.M., Nellist P.D., Van Aert S.
Physical Review Letters 121, 056101. 2/2018

Neural network Hilbert transform based filtered backprojection for fast inline X-ray inspection
Janssens E., De Beenhouwer J., Van Dael M., De Schryver T., Van Hoorebeke L., Verboven P., Nicolai B., Sijbers J.
Measurement Science and Technology 29, 3. 2/2018

Thickness dependence of scattering cross-sections in quantitative scanning transmission electron microscopy
Martinez G.T., van den Bos K.H.W., Alania M., Nellist P.D., Van Aert S.
Ultramicroscopy 187, 84. 1/2018

Bayesian analysis of noisy scanning transmission electron microscopy images for single atom detection
Fatermans J., den Dekker A.J., Müller-Caspary K., Lobato I., Van Aert S.
SCANDEM 2018, Technical University of Denmark, Kgs. Lyngby, Denmark, June 25-28, 2018.

The maximum a posteriori probability rule to detect single atoms from low signal-to-noise ratio scanning transmission electron microscopy images
Fatermans J., den Dekker A.J., Müller-Caspary K., Lobato I., Van Aert S.
IMC19, Sydney, Australia, September 9-14, 2018.

Fusion of Hyperspectral and LiDAR Data for Classification of Cloud-Shadow Mixed Remote Sensing Scene
Luo R., Liao W., Zhang H., Zhang L., Pi Y., Scheunders P., Philips W.
IEEE-JSTARS, Journal of Selected Topics in Applied Earth Observations and Remote Sensing 10, 3768. 8/2017

Building 3D statistical shape models of horticultural products
Danckaers F., Huysmans T., Van Dael M., Verboven P., Nicolai B., Sijbers J.
Food and Bioprocess Technology 10, 2100. 8/2017

Plane-dependent ML Scatter Scaling: 3D Extension of the 2D Simulated Single Scatter (SSS) Estimate
Rezaei A., Salvo K., Vahle T. , Panin V.,  Casey M.,  Boada F. , Defrise M., Nuyts J.
Phys. Med. Biol. 62,  6515-6531. 7/2017

Hybrid statistics-simulations based method for atom-counting from ADF STEM images
De wael A., De Backer A., Jones L., Nellist P.D., Van Aert S.
​Ultramicroscopy 177, 69. 06/2017

Three-dimensional atomic models from a single projection using Z-contrast imaging: verification by electron tomography and opportunities
De Backer A., Jones L., Lobato I., Altantzis T., Goris B., Nellist P.D., Bals S., Van Aert S. 
Nanoscale 9, 8791. 4/2017

Inline discrete tomography system: application to agricultural product inspection
Alves Pereira L.F., Janssens E., Cavalcanti G.D.C., Tsang I.R., Van Dael M., Verboven P., Nicolai B., Sijbers J.
Computers and Electronics in Agriculture 138, 117. 4/2017

Determining oxygen relaxations at an interface: A comparative study between transmission electron microscopy techniques
Gauquelin N., van den Bos K.H.W., Béché A., Krause F.F., Lobato I., Lazar S., Rosenauer A., Van Aert S., Verbeeck J.
Ultramicroscopy 181, 178. 3/2017

Quantitative determination of residual silver distribution in nanoporous gold and its influence on structure and catalytic performance
Mahr C., Kundu P., Lackmann A., Zanaga D., Thiel K., Schowalter M., Schwan M., Bals S., Wittstock A., Rosenauer A.
Journal of catalysis 352, 52. 3/2017

Multisensor X-ray inspection of internal defects in horticultural products
Van Dael M., Verboven P., Dhaene J., Van Hoorebeke L., Sijbers J., Nicolai B.
Postharvest Biology and Technology 128, 33. 2/2017

Comparison of methods for online inspection of apple internal quality
Van Dael M., Verboven P., Van Hoorebeke L., Sijbers J., Nicolai B.
7^th Conference on Industrial Computed Tomography – iCT 2017, Leuven, Belgium, February 7-9, 2017.

Online quality control of fruit and vegetables using X-ray imaging
Van Dael M.
Doctor of Bioscience Engineering, 2017.

How precise can atoms of a nanocluster be located in 3D using a tilt series of STEM images?
M. Alania, A. De Backer, I. Lobato, F.F. Krause, D. Van Dyck, A. Rosenauer, S. Van Aert
Ultramicroscopy, 12/2016

Detecting and locating light atoms from high-resolution STEM images: The quest for a single optimal design
Gonnissen J., De Backer A., den Dekker A.J., Sijbers J., Van Aert S.
Ultramicroscopy 170, 128. 11/2016

Atom-counting in High Resolution Electron Microscopy: TEM or STEM - that's the question.
J. Gonnissen, A. De Backer, A.J. den Dekker, J. Sijbers, S. Van Aert
Ultramicroscopy 174, 112. 10/2016

Asteroseismic versus Gaia distances: A first comparison
De Ridder J., Molenberghs G., Eyer L., Aerts C.
Astronomy & Astrophysics 595, id.L3, 5 pp., 9/2016

Unscrambling Mixed Elements using High Angle Annular Dark Field Scanning Transmission Electron Microscopy
van den Bos K.H.W., De Backer A., Martinez G.T., Winckelmans N., Bals S., Nellist P.D., Van Aert S.
Physical Review Letters 116, 246101. 06/2016

StatSTEM: An efficient approach for accurate and precise model-based quantification of atomic resolution electron microscopy images
De Backer A., van den Bos K.H.W., Van den Broek W., Sijbers J., Van Aert S. 
Ultramicroscopy 171, 104. 6/2016

Locating light and heavy atomic column positions with picometer precision using ISTEM
van den Bos K.H.W., Krause F.F., Béché A., Verbeeck J., Rosenauer A., Van Aert S.
Ultramicroscopy 172, 75. 6/2016

Quantifying a Heterogeneous Ru Catalyst on Carbon Black Using ADF STEM
Varambhia A.M., Jones L., De Backer A., Fauske V.T., Van Aert S., Ozkaya D., Nellist P.D.
Particle & Particle Systems Characterization 33, 438. 06/2016

In-line NDT with X-ray CT combining sample rotation and translation
De Schryver T., Dhaene J., Dierick M., Boone M.N., Janssens E., Sijbers J., Van Dael M., Verboven P., Nicolai B., Van Hoorebeke L.
NDT & E International 89, 89. 4/2016

How precise can atoms of a nanocluster be located in 3D using a tilt series of scanning transmission electron microscopy images?
Alania M., De Backer A., Lobato I., Krause F.F., Van Dyck D., Rosenauer A., Van Aert S.
Ultramicroscopy 181, 134. 4/2016

D-BRAIN: Anatomically Accurate Simulated Diffusion MRI Brain Data
Perrone D., Jeurissen B., Aelterman J., Roine T., Sijbers J., Pizurica A., Leemans A., Philips W.
PlosOne 11, 1., 3/2016

Measurement of atomic electric fields and charge densities from average momentum transfers using scanning transmission electron microscopy
Müller-Caspary K., Krause F.F., Grieb T., Loffler S., Schowalter M., Béché A., Galioit V., Marquardt D., Zweck J., Schattschneider P., Verbeeck J., Rosenauer A.
Ultramicroscopy 178, 62. 2/2016

Advanced electron crystallography through model-based imaging
Van Aert S., De Backer A., Martinez G.T., den Dekker A.J., Van Dyck D., Bals S., Van Tendeloo G.
Iucrj 3, 71. 1/2016

A segmentation and classification algorithm for online detection of internal disorders in citrus using X-ray radiographs
Van Dael M., Lebotsa S., Herremans E., Verboven P., Sijbers J., Opara U.L., Cronje U.L., Nicolai B.
Postharvest Biology and Technology 112, 205. 4/2015

Fast inline inspection by neural network based filtered backprojection: Application to apple inspection
Janssens E., Alves Pereira L.F., De Beenhouwer J., Tsang I.R., Van Dael M., Verboven P., Nicolai B., Sijbers J.
Case studies in Nondestructive Testing and Evaluation 6, 14.

Classification of hyperspectral images with very small training size using sparse unmixing
Andrejchenko V., Heylen R., Scheunders P., Philips W., Liao W.
IEEE International Geoscience and Remote Sensing Symposium (IGARSS), Beijing, China.

Lidar information extraction by attribute filters with partial reconstruction
Liao W., M Mura D., Huang X., Chanussot J., Gautama S., Scheunders P., Philips W.
IEEE IGARSS 2016, International Geoscience and Remote Sensing Symposium, pp. 1484-1487, Beijing, July 10-15, 2016.

Investigating lattice strain in Au nanodecahedrons
Goris B., De Beenhouwer J., De Backer A., Zanaga D., Batenburg K.J., Sánchez-Iglesias A., Liz-Marzán L.M., Van Aert S., Sijbers J., Van Tendeloo G., Bals S.
European Microscopy Congress – EMC 2016, Lyon, France, August 28 – September 2, 2016, IM01-OP038.

Plane-dependent ML scatter scaling: 3D extension of the 2D simulated single scatter estimate
Rezaei A., Salvo K., Panin V., Koesters T., Casey M., Boada F., Defrise M., Nuyts J.
IEEE Nuclear Science Symposium and Medical Imaging Conference, Strasbourg, France, October-November 2016, M07-6.

Fast X-ray computed tomography via image completion
Alves Pereira L.F., Janssens E., Van Dael M., Verboven P., Nicolai B., Cavalcanti G.D.C., Tsang I.J., Sijbers J.
6^th conference on Industrial Computed Tomography – iCT 2016, Wels, Austria, February 9-12, 2016.

Understanding microstructural deformation of apple tissue from 4D micro-CT imaging
Wang Z., Rogge S., Abera M., Van Dael M., Van Nieuwenhove V., Verboven P., Sijbers J., Nicolai B.
ISHS Symposium 2016: Sensing Plant Water Status – Methods and Applications in Horticultural Science, Potsdam, Germany, October 5-7, 2016.

Combining 3D vision and X-ray radiography for internal quality inspection of foods
Van Dael M., Danckaers F., De Schryver T., Huysmans T., Verboven P., Van Hoorebeke L., Sijbers J., Nicolai B.
30th Targeted Technologies for Sustainable Food Systems (EFFoST) International Conference, Vienna, Austria, November 28-30, 2016.

Building a statistical shape model of the interior and exterior of the bell pepper
Danckaers F., Huysmans T., Rogge S., Van Dael M., Verboven P., Nicolai B., Sijbers J.
30^th Targeted Technologies for Sustainable Food Systems (EFFoST) International Conference, Vienna, Austria, November 28-30, 2016.

Automated quality control and selection
Van Dael M., Verboven P., Nicolai B., Dhaene J., Van Hoorebeke L., Sijbers J.
no. PCT/EP2016/055718, 2016.