For our material research, we have the following equipment available:

Contact Angle Goniometer

  • Drop contact angle

Stylus Profiler (DektaXT)

  • Surface profiling, step height layer thickness, surface roughness

Drying stoves and Furnaces

FTIR Spectrometer/Attunuated Total Reflection

  • Material and film analaysis on transparent and opaque materials

In-situ FTIR reaction cell

  • Material analysis

Irradiance spectrometer

  • Wavelength and irradiance distribution

Potentiostat

  • Electrochemical measurements

Spincoater

  • Substrates of 1.5-15 cm diameter
  • 100 - 13000 rpm

Surface area and porosity analyser + Flowprep

  • Specific surface area
  • Pore size distribution

Surface Photovoltage Spectroscopy

  • Surface photovoltage measurements on semiconductor powders

UV-VIS spectrometer

  • UV-DRS spectra powder samples
  • UV-VIS spectrophotometry of various solutions (dyes, organics, etc.)

XE-lamp + monochromator

  • High power light source

 

Contact: Sammy Verbruggen