Holding large variety of analytical and preparative techniques at hand, we offer an entire research package, from qualified specimen preparation, high-quality observations to competent interpretation of the results and report. Investigation will be performed timely and accurately by well-trained specialists with top-level instruments. Being a versatile analytical tool, electron microscopy can be applied to a wide range of problems, relevant for materials science:

  • observation of microstructure, quantification of size and shape of (nano)particles, detecting coating layers
  • characterization of defects in crystalline materials
  • imaging thin films and multilayer structures with atomic resolution analysis of local chemical composition, elemental mapping down to atomic scale
  • strain mapping
  • analysis of chemical bonding and oxidation state using electron energy loss spectroscopy
  • three-dimensional (3D) imaging of particles, precipitates or inclusions

EMAT offers TEM sample preparation including mechanical, chemical and electrochemical polishing, ion beam milling and site-specific sample preparation using focused ion beam (FIB). Air-sensitive samples can be treated under Ar atmosphere (<0.1 ppm O2 and H2O) including transportation to the microscope column completely excluding contact with air.

TEM investigation can be also complemented with SEM analysis and X-ray powder diffraction, which will provide knowledge on:

  • morphology and surface using conventional or FEG-SEM
  • SEM observations at environmental conditions
  • quantitative phase composition of your samples using energy-dispersive (EDX) or wave-dispersive (WDX) analysis;
  • precise lattice parameters;
  • particle size and strain;
  • crystal structure from the Rietveld method.

EMAT offers training of your researchers in practical/theoretical applications of SEM and TEM aimed at:

obtaining practical skills in basic and/or advanced SEM and/or TEM techniques;
obtaining skills in interpretation and treatment of TEM results.