Armand Béché

Postdoctoral Researcher

Research Group


Personal Data & Academic Degrees

  • Place & date of birth: Laval (France), 8th July 1983.
  • Master degree in Material Science, INPG, Grenoble (Sept. 2006)
  • Engineering degree in Material Science, INPG, Grenoble (Sept. 2006)
  • Ph.D. in Physics (13th October 2009): "Strain measurement at the nanometer scale using transmission electron microscopy"

Scientific Career

  • 2006-2009: PhD researcher at CEA (Commissariat à l'Energie Atomique), Grenoble
  • 2010-2011: PostDoc as TEM Applications Specialist at FEI Company
  • 2011- October 2012: Research Scientist at FEI Company
  • November 2012- now: Research Scientist at EMAT

Main topics of Interest

  • Strain measurement (NBED, Dark Field Electron Holography, HRTEM/GPA, CBED, ...)
  • High Resolution Imaging (HRSTEM, HRTEM) using probe and/or image Cs correction
  • Monochromated STEM-EELS
  • Electron vortex beam development

Key Publications

Improved precision in strain measurement using nanobeam electron diffraction
Béché A., Rouvière J. L.,Clément L. & Hartmann J. M.
Applied Physics Letters, 2009, 95, 123114

Dark field electron holography for quantitative strain measurements with nanometer-scale spatial resolution
Cooper D., Barnes J.P, Hartmann, J.M., Béché A. & Rouvière, J.L.
Applied Physics Letters, 2009, 95, 053501
DOI: 10.1063/1.3196549

Dark field electron holography for strain measurement
Béché A., Rouvière J.L., Barnes J.P. & Cooper D
Ultramicroscopy, 2011, 111, 227-238

Quantitative strain mapping of InAs/InP quantum dots with 1 nm spatial resolution using dark field electron holography
Cooper, D., Rouvière, J.-L., Béché, A., Kadkhodazadeh, S., Semenova, E. S., Yvind, K. & Dunin-Borkowski, R.
Applied Physics Letters, 2011, 99, 261911-261911-3
doi: 10.1063/1.3672194

A new way of producing electron vortex probes for STEM
Verbeeck, J., Tian, H. & Béché, A.
Ultramicroscopy, 2011, 113, 83-87

A holographic method to measure the source size broadening in STEM
Verbeeck, J., Béché A. & Van den Broek, W.
Ultramicroscopy, 2012, 120, 35-40
doi: 10.1016/j.ultramic.2012.05.007



Armand Béché Tel. +32 3 265 34 72
Fax +32 3 265 33 18