Armand Béché

Postdoctoral Researcher

Publications in the spotlight

Strain measurement in semiconductor FinFET devices using a novel moiré demodulation technique
Prabhakara Viveksharma   Jannis Daen   Béché Armand   Bender Hugo   Verbeeck Johan  
Semiconductor science and technology - ISSN 0268-1242-35:3 (2020) p. 1-15
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Evaluation of different rectangular scan strategies for STEM imaging
Velazco A.   Nord Magnus   Béché Armand   Verbeeck Johan  
Ultramicroscopy - ISSN 0304-3991-215 (2020) p. 1-10
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Three-dimensional quantification of the facet evolution of Pt nanoparticles in a variable gaseous environment
Altantzis Thomas   Lobato Hoyos Ivan Pedro   de Backer Annick   Béché Armand   Zhang Yang   Basak Shibabrata   Porcu Mauro   Xu Qiang   Sánchez-Iglesias Ana   Liz-Marzán Luis M.   Van Tendeloo Gustaaf   Van Aert Sandra   Bals Sara  
Nano letters - ISSN 1530-6984-19:1 (2019) p. 477-481
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Control of knock-on damage for 3D atomic scale quantification of nanostructures : making every electron count in scanning transmission electron microscopy
Van Aert Sandra   de Backer Annick   Jones Lewys   Martinez Gerardo   Béché Armand   Nellist Peter D.  
Physical review letters - ISSN 0031-9007-122:6 (2019)
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Spectroscopic coincidence experiments in transmission electron microscopy
Jannis Daen   Müller-Caspary Knut   Béché Armand   Oelsner Andreas   Verbeeck Johan  
Applied physics letters - ISSN 0003-6951-114:14 (2019)
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Full bibliography of this author