Unconventional Measurement Setups for TEM
21 september 2018
UAntwerp, Campus Groenenborger, Room U.408 - Groenenborgerlaan 171 - 2020 Antwerpen (route: UAntwerpen, Campus Groenenborger
11.30 - 12.30 uur
Organisatie / co-organisatie:
Friday Lecture by Daen Jannis (EMAT)
About the lecture
Although TEM has become a routine technique for structure and composition determination of materials down to the atomic scale, many unconventional measurement setups remain unexplored. In this talk I will describe experiments with 3 different setups that explore new directions in TEM. In a first experiment we explore the time correlation between inelastic electron scattering events as commonly used in EELS and the generation of X-rays as typically used in energy dispersive X-ray spectroscopy.
This correlation becomes available through a novel delay line detector setup and promises to combine the benefits of both EELS (energy resolution) and EDX spectroscopy (no background) in a novel spectroscopic setup. A second experiment exploits the newly gained freedom in scanning strategy for STEM through the use of a versatile programmable scan engine. This programmability gives us the possibility to use exotic scanning patterns providing several benefits over conventional raster scanning.
Finally, in a third computational effort we explore the phase modulation of electron beams through the use of a programmable electrostatic phase plate. Simulations in SIMION provide insights to further optimize the design parameters of this device which is currently being developed at EMAT.
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