Unconventional Measurement Setups for TEM

Datum: 21 september 2018

Locatie: UAntwerp, Campus Groenenborger, Room U.408 - Groenenborgerlaan 171 - 2020 Antwerpen (route: UAntwerpen, Campus Groenenborger)

Tijdstip: 11.30 - 12.30 uur

Organisatie / co-organisatie: EMAT

Korte beschrijving: Friday Lecture by Daen Jannis (EMAT)



About the lecture

Although TEM has become a routine technique for structure and composition determination of materials down to the atomic scale, many unconventional measurement setups remain unexplored. In this talk I will describe experiments with 3 different setups that explore new directions in TEM. In a first experiment we explore the time correlation between inelastic electron scattering events as commonly used in EELS and the generation of X-rays as typically used in energy dispersive X-ray spectroscopy.

This correlation becomes available through a novel delay line detector setup and promises to combine the benefits of both EELS (energy resolution) and EDX spectroscopy (no background) in a novel spectroscopic setup. A second experiment exploits the newly gained freedom in scanning strategy for STEM through the use of a versatile programmable scan engine. This programmability  gives us the possibility to use exotic scanning patterns providing several benefits over conventional raster scanning.

Finally, in a third computational effort we explore the phase modulation of electron beams through the use of a programmable electrostatic phase plate. Simulations in SIMION provide insights to further optimize the design parameters of this device which is currently being developed at EMAT.



Contact e-mail: liesbet.laurens@uantwerpen.be

Link: https://www.uantwerpen.be/en/research-groups/emat/news-and-activities/friday-lectures/#