Novel developments in high resolution TEM tomography

Date: 10 May 2019

Venue: UAntwerp, Campus Groenenborger, Room U.408 - Groenenborgerlaan 171 - 2020 Antwerpen - Wilrijk (route: UAntwerpen, Campus Groenenborger)

Time: 11:30 AM - 12:30 PM

Organization / co-organization: EMAT

Short description: Friday Lecture by Qiongyang Chen, EMAT

Abstract: Electron tomography is  a powerful 3D imaging technology ,which enable visualization and quantification of the internal microstructure of objects. Even though atomic resolution tomography has become possible ,several limitations still exist. One of the main problem is the inevitable degradation of the sample produced by the electron beam during the acquisition of the tilt-series. These shortcomings can be overcome by the developments both in novel ultra-sensitive detectors and techniques.

In this talk, I will introduce my PhD project, which contains two objectives: one is Fast(4D) TEM tomography. We plan to achieve some time-dependent processes investigation through the use of a novel ultra-sensitive detector that is able to acquire a large number of images (~5000) in 10 seconds and the heating holders for tomography ( developed by DENSsolutions). These developments  will enable high resolution 4D tomography and will provide valuable experimental data to reconstruction algorithms. Another is Multi-mode tomography. Most reconstructions at atomic scale are obtained by using only one type of imaging technique, high angle annular dark field scanning transmission electron microscopy(HAADF-STEM).However much more information can be extracted by combining other different techniques, such as EDX, EELS and diffraction tomography. The simultaneous acquisition of complementary information will greatly improve the speed and the accuracy of reconstructions and provide information beyond 3D geometrical structure of nano-size objects by providing chemical information.