In situ nanomechanics in nanostructured materials using quantitative orientation mapping in TEM
30 October 2020
Campus Groenenborger - Groenenborgerlaan 171 - 2020 Antwerp, Wilrijk (route: UAntwerpen, Campus Groenenborger
11:30 AM - 12:30 PM
Organization / co-organization:
Friday Lecture by Ankush Kashiwar
About the lecture
Advanced in situ transmission electron microscopy (TEM) techniques become indispensable for the real time investigation of thermal, mechanical or electrochemical response of nanostructured materials with high spatial and temporal resolution. Automated crystal orientation mapping in TEM (ACOM-TEM) is a 4D STEM imaging involving a precessing electron beam which can provide information on the crystallographic orientation and phases with a spatial resolution of a nanometer and good statistics for a reliable quantification. A combination of in situ nanomechanics and precession electron diffraction based ACOM-TEM for direct observation of deformation processes and their quantitative analysis in nanocrystalline metallic thin films under cyclic mechanical deformation has been introduced. The unique experimental approach involving combination of these advanced electron microscopy techniques has enabled gaining deeper insights into the nanomechanical behavior and plasticity of the nanocrystalline materials.
This is an online lecture which can be followed via Teams Windows.