Improving the low-dose performance of aberration correction in single sideband ptychography
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Ultramicroscopy - ISSN 0304-3991-277 (2025) p. 1-6
Removing constraints of 4D-STEM with a framework for event-driven acquisition and processing
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Ultramicroscopy - ISSN 0304-3991-277 (2025) p. 1-12
High-resolution electron microscopy imaging of MOFs at optimized electron dose
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Journal of materials chemistry A : materials for energy and sustainability - ISSN 2050-7488-13:6 (2025) p. 4281-4291
Core-loss EELS dataset and neural networks for element identification
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Zenodo, 2023,
Deep learning for automated materials characterisation in core-loss electron energy loss spectroscopy
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Scientific reports - ISSN 2045-2322-13:1 (2023) p. 1-10