Improving the low-dose performance of aberration correction in single sideband ptychography
Source
Ultramicroscopy - ISSN 0304-3991-277 (2025) p. 1-6
Removing constraints of 4D-STEM with a framework for event-driven acquisition and processing
Source
Ultramicroscopy - ISSN 0304-3991-277 (2025) p. 1-12
Removing constraints of 4D-STEM with a framework for event-driven acquisition and processing
Source
Zenodo, 2025,
High-resolution electron microscopy imaging of MOFs at optimized electron dose
Source
Journal of materials chemistry A : materials for energy and sustainability - ISSN 2050-7488-13:6 (2025) p. 4281-4291
Core-loss EELS dataset and neural networks for element identification
Source
Zenodo, 2023,