Tuning intersystem crossing to triplet excitons in sp³-functionalized (6,5) carbon nanotubes through defect density and functional groups
Source
ACS nano - ISSN 1936-0851-19:41 (2025) p. 36384-36396
Signal inversion and defect selectivity in charge pumping electrically detected magnetic resonance of a 4H-SiC n-channel metal-oxide-semiconductor field-effect transistor
Source
Applied physics letters - ISSN 0003-6951-126:20 (2025) p. 1-18
Integration of electrically detected magnetic resonance on a chip (EDMRoC) with charge pumping for low-cost and sensitive defect characterization in silicon carbide metal–oxide–semiconductor field-effect transistors
Source
Journal of applied physics - ISSN 0021-8979-137:6 (2025) p. 1-23
Broadening of the silicon vacancy EPR line in SiC revealed through optically selective excitation
Source
Magnetic resonance in solids - ISSN 2072-5981-26:2 (2024) p. 1-9
Complications of charge pumping analysis for silicon carbide MOSFETs
Source
Materials science forum - ISSN 1662-9752-1090 (2023) p. 171-178