Optoelectronic properties of atomic layer deposited and sputtered MoS₂ films
Source
ACS applied materials and interfaces - ISSN 1944-8244-17:33 (2025) p. 47347-47354
Charge-discharge mechanisms in $O3-Na_{x}Fe_{0.5}Mn_{0.5}O_{2}$ Na-ion battery electrodes-unraveling the structure of the X-phase
Source
Chemistry of materials - ISSN 0897-4756-37:14 (2025) p. 5234-5248
Removing constraints of 4D-STEM with a framework for event-driven acquisition and processing
Source
Ultramicroscopy - ISSN 0304-3991-277 (2025) p. 1-12
Influence of atmospheric conditions on the structural evolution upon heating of the ZnAl-layered double hydroxide : a comprehensive in situ transmission electron microscopy study
Source
ACS applied materials and interfaces - ISSN 1944-8244-17:26 (2025) p. 38587-38596
Transmission electron microscopy studies of catalysts and catalyst carriers for CO2 absorption and reduction reactions
Source
Antwerpen, University of Antwerp, Faculty of Science, Department of Physics, 2025,154 p.