Secondary electron topographical contrast formation in scanning transmission electron microscopy
Source
Ultramicroscopy - ISSN 0304-3991-280 (2026) p. 1-6
Obtaining 3D atomic reconstructions from electron microscopy images using a Bayesian genetic algorithm : possibilities, insights, and limitations
Source
Microscopy and microanalysis - ISSN 1431-9276-31:1 (2024) p. 1-9