Abstract: 

he three-dimensional (3D) atomic structure of nanomaterials, including strain, is crucial to understand their properties. Here, we investigate lattice strain in Au nanodecahedra using electron tomography. Although different electron tomography techniques enabled 3D characterizations of nanostructures at the atomic level, a reliable determination of lattice strain is not straightforward. We, therefore, propose a novel model-based approach from which atomic coordinates are measured. Our findings demonstrate the importance of investigating lattice strain in 3D.







Publications: 

B. GorisDe Beenhouwer, J.De Backer, A.Zanaga, D.Batenburg, K. J.Sánchez-Iglesias, A.Liz-Marzán, L. M.Van Aert, S.Bals, S.Sijbers, J., and Van Tendeloo, G.“Measuring Lattice Strain in Three Dimensions through Electron Microscopy”, Nano Letters, vol. 15, no. 10, pp. 6996–7001, 2015.

Main researcher(s): 

Jan De Beenhouwer

Jan Sijbers

Research Area: 

Tomography

Electron Microscopy

Research keywords:

 Reconstruction