Phase offset method of ptychographic contrast reversal correction
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Ultramicroscopy - ISSN 0304-3991-258 (2024) p. 1-8
Overcoming contrast reversals in focused probe ptychography of thick materials : an optimal pipeline for efficiently determining local atomic structure in materials science
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Applied physics letters - ISSN 0003-6951-121:8 (2022) p. 1-6
Event driven 4D STEM acquisition with a Timepix3 detector: microsecond dwelltime and faster scans for high precision and low dose applications
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