Characterization of defects, modulations and surface layers in topological insulators and structurally related compounds

Source
Antwerpen, Universiteit Antwerpen, Faculteit Wetenschappen, Departement Fysica, 2020,180 p.
Author(s)

Atomic scale analysis of defect clustering and predictions of their concentrations in $UO_{2+x}$

Source
Journal of nuclear materials - ISSN 0022-3115-541 (2020) p.
Author(s)
    Emre Caglak, Kevin Govers, Dirk Lamoen, Pierre-Etienne Labeau, Marc Verwerft