Element specific atom counting for heterogeneous nanostructures : combining multiple ADF STEM images for simultaneous thickness and composition determination
Source
Ultramicroscopy - ISSN 0304-3991-259 (2024) p. 1-10
Atom counting from a combination of two ADF STEM images
Source
Ultramicroscopy - ISSN 0304-3991-255 (2024) p. 1-10
Three approaches for representing the statistical uncertainty on atom-counting results in quantitative ADF STEM
Source
Microscopy and microanalysis - ISSN 1431-9276-29:1 (2023) p. 374-383
Optimal experiment design for element specific atom counting using multiple annular dark field scanning transmission electron microscopy detectors
Source
Ultramicroscopy - ISSN 0304-3991-242 (2022) p. 1-10