Exploiting secondary electrons in transmission electron microscopy for 3D characterization of nanoparticle morphologies

Source
Antwerpen, University of Antwerp, Faculty of Science, 2024,x, 118 p.

Secondary electron induced current in scanning transmission electron microscopy : an alternative way to visualize the morphology of nanoparticles

Source
ACS materials letters - ISSN 2639-4979-5:7 (2023) p. 1916-1921
Author(s)