Exploring the floating body effect in bulk nFET devices for enhanced physical reservoir computing

Source
IEEE transactions on electron devices - ISSN 0018-9383-73:7 (2026) p. 4439-4447
Author(s)
    Y.Y. Guo, R. Degraeve, P. Saraza Canflanca, Jonas Eerdekens, E. Bury, I. Verbauwhede