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			Ultramicroscopy - ISSN 0304-3991-277 (2025) p. 1-6
					
Removing constraints of 4D-STEM with a framework for event-driven acquisition and processing
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High-resolution electron microscopy imaging of MOFs at optimized electron dose
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Core-loss EELS dataset and neural networks for element identification
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			Zenodo, 2023,
					
Deep learning for automated materials characterisation in core-loss electron energy loss spectroscopy
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