High-strain-induced local modification of the electronic properties of VO₂ thin films
Bron
ACS applied electronic materials - ISSN 2637-6113-4:12 (2022) p. 6020-6028
Overcoming contrast reversals in focused probe ptychography of thick materials : an optimal pipeline for efficiently determining local atomic structure in materials science
Bron
Applied physics letters - ISSN 0003-6951-121:8 (2022) p. 1-6
Atomically engineered interfaces yield extraordinary electrostriction
Bron
Nature - ISSN 0028-0836-609:7928 (2022) p. 695-700
Resistance minimum in $LaAlO_{3}/Eu_{1-x}La_{x}TiO_{3}/SrTiO_{3}$ heterostructures
Bron
Physical review materials - ISSN 2475-9953-6:7 (2022) p. 1-10
Real-time integration center of mass (riCOM) reconstruction for 4D STEM
Bron
Microscopy and microanalysis - ISSN 1431-9276-28:5 (2022) p. 1526-1537