Signal inversion and defect selectivity in charge pumping electrically detected magnetic resonance of a 4H-SiC n-channel metal-oxide-semiconductor field-effect transistor
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Applied physics letters - ISSN 0003-6951-126:20 (2025) p. 1-18
Integration of electrically detected magnetic resonance on a chip (EDMRoC) with charge pumping for low-cost and sensitive defect characterization in silicon carbide metal–oxide–semiconductor field-effect transistors
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Journal of applied physics - ISSN 0021-8979-137:6 (2025) p. 1-23
Broadening of the silicon vacancy EPR line in SiC revealed through optically selective excitation
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Magnetic resonance in solids - ISSN 2072-5981-26:2 (2024) p. 1-9
Complications of charge pumping analysis for silicon carbide MOSFETs
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Materials science forum - ISSN 1662-9752-1090 (2023) p. 171-178
Chirality dependence of triplet excitons in (6,5) and (7,5) single-wall carbon nanotubes revealed by optically detected magnetic resonance
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ACS nano - ISSN 1936-0851-17:3 (2023) p. 2190-2204