Exploiting secondary electrons in transmission electron microscopy for 3D characterization of nanoparticle morphologies

Bron
Antwerpen, University of Antwerp, Faculty of Science, 2024,x, 118 p.

Secondary electron induced current in scanning transmission electron microscopy : an alternative way to visualize the morphology of nanoparticles

Bron
ACS materials letters - ISSN 2639-4979-5:7 (2023) p. 1916-1921
Auteur(s)