StatSTEM : an efficient approach for accurate and precise model-based quantification of atomic resolution electron microscopy images
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Ultramicroscopy - ISSN 0304-3991-171 (2016) p. 104-116
Unscrambling mixed elements using high angle annular dark field scanning transmission electron microscopy
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Advanced electron crystallography through model-based imaging
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Measuring lattice strain in three dimensions through electron microscopy
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Optimal experimental design for nano-particle atom-counting from high-resolution STEM images
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