Electron microscopy for materials science search menu search content Measurements down to picometer precision Measurements down to picometer precision In recent years, visual interpretability of electron microscopy images was significantly improved by aberration corrected electron optics. Instrument…

Electron microscopy for materials science search menu search content (S)TEM imaging in 2D and 3D (a) Bright field TEM image visualizing size and CeO2 nanoparticles; (b) high resolution TEM image of structural modulations in Li-ion conductor Li3xNd2/3−xTiO3; (c) HAADF-STEM image of the SnO2 whisker…

Electron microscopy for materials science search menu search content TEM/STEM Transmission Electron Microscopes Thermo Fisher Advan-TEM This instrument, installed in June 2019, strengthens our TEM instrumentation with improved spatial and energy resolution. The presence of an X-Feg gun coupled to a …

Electron microscopy for materials science search menu search content Spectroscopy and Chemical Analysis TEM image (left) and energy filtered TEM (EFTEM) image (right) of Fe and Co nanowires and Fe3O4 nanotubes showing distribution of Fe, oxygen and carbon in the sample. HAADF-STEM image (left) of ca…

IOF NANO search menu search content Microscopes TEM/STEM - SEM EMAT hosts 6 Transmission Electron Microscopes 3 Scanning Electron Microscopes. The former include two aberration corrected Titan cube instruments, the latter a dual beam and an environmental instrument. Thermo Fisher QU-Ant-EM This uniq…

Electron microscopy for materials science search menu search content Soft matter and sensitive materials Soft matter and sensitive materials Polymers, porous materials and hybrid combinations of soft matter with inorganic components play an increasingly important role in the field of nanoscience. Th…

IOF NANO search menu search content Specimen Preparation Since electrons only penetrate without too much energy spread through a maximum thickness of some hundred nanometer of solid material, samples for TEM have to be thinned to below this limit. Thinning methods depend on the material and the obse…

Electron microscopy for materials science search menu search content Specimen Preparation Since electrons only penetrate without too much energy spread through a maximum thickness of some hundred nanometer of solid material, samples for TEM have to be thinned to below this limit. Thinning methods de…

Annick De Backer senior researcher My website Annick De Backer Research Group Personal Data & Academic Degrees Place & date of birth: Brasschaat, 23-10-1987 Master Sc. Physics: University of Antwerp , 2010 Ph.D. Physics: "Quantitative atomic resolution electron microscopy using advanced statistical …

Electron microscopy for materials science search menu search content EELS to the extreme EELS to the extreme Electron energy loss spectroscopy (EELS) is based on the inelastic scattering of high energy electrons in materials. The energy loss of the primary electrons passing through the sample is mea…

NANOlight Center of Excellence search menu search content NANOlab day Sept 18 2023 The NANOlab day 2023 will take place in the T building of the Groeneborger campus on Sept 18th 2023 and will consist of contributions from all the NANOlab groups in the form of short talks and poster presentations. Th…

Electron microscopy for materials science search menu search content Covers Pattern Formation by Electric-Field Quench in a Mott Crystal // Nicolas Gauquelin, Daen Jannis, Johan Verbeeck et all // cover Gert De Bont // Nano Letters 09/2023 Chiral SeededGrowth of Gold Nanorods Into Fourfold Twisted N…

Electron microscopy for materials science search menu search content Friday Lectures Friday lecture | 15 November 2024 by Saleh Gholam 4D-STEM Tomography as a Tool for Solving the Structure of Nanoparticles Practical location (online link) by invitation only Time: 11:30 Abstract Over the past decade…

Sara Bals gewoon hoogleraar Onderzoek Sara Bals Onderzoeksgroep Elektronenmicroscopie voor materiaalonderzoek (EMAT) Expertise Sara Bals is expert in de toepassing en ontwikkeling van elektronentomografie voor functionele nanomaterialen. Door de modernste elektronenmicroscopie te combineren met geav…

Electron microscopy for materials science search menu search content PhD and Posters Posters The posters presented by EMAT-members at different international conferences are collected within a Flickr account, so they are also on exhibit after the conferences are finished. If you would like to browse…

Sara Bals full research professor Research Sara Bals Research team Electron microscopy for materials research (EMAT) Expertise Sara Bals is an expert in the application and development of electron tomography for functional nanomaterials. By combining state-of-the-art electron microscopy with advance…

Staf Van Tendeloo emeritus occasionele opdracht - gastprofessor Onderzoek Staf Van Tendeloo Onderzoeksgroep Elektronenmicroscopie voor materiaalonderzoek (EMAT) Expertise - Materiaal onderzoek via het gebruik van electronenmicroscopie. Ondersteuning instandhouding wetenschappelijke apparatuur (EMAT)…

Staf Van Tendeloo emeritus occasional assignment - guest professor Research Staf Van Tendeloo Research team Electron microscopy for materials research (EMAT) Expertise - Materials study by means of electron microscopy Support maintenance scientific equipment (EMAT). 01/01/2005 - 31/12/2024 Abstract …

Electron microscopy for materials science search menu search content Projects ERC projects at EMAT Ongoing projects Tracking Nanomaterial Performance, Towards Digital Twins of Quantum Dots Under Loading (TRACK THE TWIN). 01/12/2024 - 30/11/2028 Abstract Quantum dots (QDs) exemplify the successful tr…